UN-UW00247012C-MP

Caratteristiche del prodotto:

· Copre un'ampia gamma di distanze di lavoro

· Impostazioni di distanza e apertura bloccabili

Informazioni sul prodotto: Su richiesta sono disponibili progetti personalizzati.

For high-end PCB AOI micro-inspection, Mini/Micro LED panel pixel defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow high-temperature metal strip flaw detection, luxury anti-counterfeit printing texture inspection, electronic ceramic substrate microscopic testing, UAV high-precision aerial survey mapping and ultra-precise online dimensional measurement of micro electronic components.

· Developed for 82mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.