UN-GSWIR10020C

Caratteristiche del prodotto:

· Sviluppato per il formato immagine da 1"

· Ampia apertura, fino a F1.4

· Design compatto e leggero

Caratteristiche del prodotto:

· Sviluppato per il formato immagine da 1"
· Lunghezza d'onda: 900-1700nm
· Ampia apertura, fino a F1.4
· Design compatto e leggero

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

For semiconductor and precision electronics manufacturing inspection and alignment, new energy lithium-ion battery defect detection, ultra-thin flat panel display surface defect inspection, and high-speed printing quality inspection.

· Developed for 72mm big frame sensor

· IR correction

· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For Intelligent Transportation Systems (ITS) Applications: Road Surveillance, ANPR/ALPR, Automatic Incident Detection, Traffic Enforcement Systems, Railway/Tunnel Safety Monitoring, etc.

· Excellent edge sharpness and uniform illumination
· Designed to resist strong light interference, adaptable to complex lighting conditions
· High stability and low distortion ensure measurement accuracy